Best paper award at the pattern recognition section at ERK 2016

Our paper entitled “Facial Landmark Localization from 3D Images” received the best paper award at the Pattern Recognition section at this years ERK conference.

Congratulations to all authors!

Janez Križaj, Simon Dobrišek, France Mihelič, Vitomir Štruc: Facial Landmark Localization from 3D Images. In: Proceedings of the Electrotechnical and Computer Science Conference (ERK), Portorož, Slovenia, 2016.